Bakouie, А. Measurement of Thickness and Electrophysical Parameters of Nanometer Films by means of Optical and Microwave Methods [Текст] / А. Bakouie, D. A. Usanov> // Proceedings of 18th International Conference on Microwaves, Radar and Wireless Communications MIKON-2010, Vilnius, Lithuania, 14 - 16 June 2010. - Vilnius, 2010. - P. 395 - 398 . - ISBN 978-9955-690-20-7 Рубрики: Физика ДОКУМЕНТ ПРОСМОТРЕН DE VISU: НЕТ Доп. точки доступа: Usanov, D. A. (Д-Р ФИЗ.-МАТ. НАУК, ПРОФЕССОР) Усанов, Дмитрий Александрович |